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Boost your test coverage !
Among our solutions, EASYNDUS, the DFT (Design For Test) improves the test coverage of your product and associates the best test strategy since the design phase. Discover how we have assisted one of our customers to achive its aims. 👇
01THE CHALLENGE
In increasingly competitive and demanding markets, the product reliability became a crucial issue for industrials Designers, now, have to think the test strategy for the product at the same time as design in order to guarantee performance and quality. In that context, on of our customer asked us to make the analysis of his product during the development stage to identify possibles areas of improvment.
SOLUTION
From technical date, diagrams, CAO & BOM furnished by the customer, we have assessed in a first time, the theorical test coverage of the future product thanks to TestWay and TestExpert softwares, tools references for the test sector. We have verified quite a few criteria, including test points and identified major problems which would prevent the best testability. Then, we have worked on differents recommendations to optimize the test coverage : add-on of test points, modification of nails placements, adjustements of Boundary scan line, changes of electronics schematics and routing… With all these proposals for improvments, we have also furnished a new simulation of test coverage allowing to see the added-value of our recommendations. To reach this level of sustainibility, we have proposed too the most adapted test strategy, selecting the best test means according to the product and its aims.
RESULTS
Test coverage optimized
Tailor-made test strategy
Test quality improved
Test time reduced
Investment cost controled
Our DFT approach lies on regular exchanges with the customer all along the analysis via a fill regrouping all comments, decisions and design evolutions. After the analysis, our customer has implemented mos tour recommendation and has choosen our test strategy. He has significantly improved its product testability : test coverage increased, routing optimized to ensure accessibility to the test points, reduction of time test during manufacturing cycle. Also, on manufacturing industrial process, the strategy has reduced investment costs of test benches.
THE DFT IN A NUTSHELL
Why? Secure and make reliable a product, improve its testability, reduce time and costs of tests.
How? Optimizing the design product for test, balancing test strategy ( AOI, X-ray, Boundary Scan, functional test)
When? During the design stage of a new product or during a re-design.